Tokyo, Japan

Masaki Takenaka

This inventor holds 2 USPTO granted patents. Top assignee: Nkk Corporation. Active years: 1993-1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masaki Takenaka. Retrieved from https://idiyas.com/inventor/masaki-takenaka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.8

ph-index = 2

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 1993-1996

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2 patents (USPTO):Explore Patents

Title: Masaki Takenaka: Innovator in Magnetic Inspection Technology

Introduction

Masaki Takenaka is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of magnetic inspection technology. With a total of 2 patents, his work focuses on enhancing the detection of defects in various objects.

Latest Patents

Masaki Takenaka's latest patents include a "Method and apparatus for magnetically detecting defects in an object" and a "Magnetic inspection apparatus for thin steel strip having magnetizer." These innovations demonstrate his commitment to improving inspection techniques in industrial applications.

Career Highlights

Masaki Takenaka is currently employed at NKK Corporation, where he applies his expertise in magnetic inspection technology. His work has been instrumental in advancing the capabilities of defect detection in manufacturing processes.

Collaborations

Throughout his career, Masaki has collaborated with notable colleagues, including Seigo Ando and Kenichi Iwanaga. These partnerships have contributed to the development of innovative solutions in the field.

Conclusion

Masaki Takenaka's contributions to magnetic inspection technology highlight his role as a key innovator in the industry. His patents and collaborations reflect his dedication to advancing technology for better defect detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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