Toyama, Japan

Masaki Taguchi

This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masaki Taguchi. Retrieved from https://idiyas.com/inventor/masaki-taguchi-somkh5lm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Masaki Taguchi: Innovator in Semiconductor Production Monitoring

Introduction

Masaki Taguchi is a notable inventor based in Toyama, Japan. He has made significant contributions to the field of semiconductor production through his innovative ideas and patents. His work focuses on enhancing the efficiency and reliability of semiconductor manufacturing processes.

Latest Patents

Masaki Taguchi holds a patent for a "System and method for monitoring semiconductor production apparatus." This invention involves acquiring a plurality of pieces of process data from a semiconductor production apparatus while it is in operation. A multivariate analysis model is then created using at least a portion of this data, which helps in optimizing production processes.

Career Highlights

Masaki Taguchi is associated with Matsushita Electric Industrial Co., Ltd., a leading company in the electronics industry. His role in the company has allowed him to work on cutting-edge technologies that advance semiconductor manufacturing.

Collaborations

Masaki collaborates with Shinichi Imai, a fellow innovator in the field. Their partnership has contributed to the development of advanced monitoring systems for semiconductor production.

Conclusion

Masaki Taguchi's contributions to semiconductor production monitoring exemplify the importance of innovation in technology. His patent and collaborative efforts continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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