Tokyo, Japan

Masahiko Nagahama

This inventor holds 11 USPTO granted patents and 1 EPO patent. Top assignees: The Yokohama Rubber Co., Ltd., Takata Corporation. Active years: 1994-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masahiko Nagahama. Retrieved from https://idiyas.com/inventor/masahiko-nagahama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 90.9


Average Co-Inventor Count = 2.3

ph-index = 7

Forward Citations = 188(Granted Patents)


Location History:

  • Kamakura, JP (1994)
  • Tokyo, JP (1996 - 2016)

Company Filing History:


Years Active: 1994-2016

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11 patents (USPTO):Explore Patents

Title: Masahiko Nagahama: Innovator in Speed Measurement Technology

Introduction

Masahiko Nagahama is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of speed measurement technology, holding a total of 11 patents. His innovative work has had a lasting impact on various industries.

Latest Patents

One of his latest inventions is a speed measuring device, which showcases his expertise in developing advanced measurement technologies. This device is designed to enhance accuracy and efficiency in speed measurement applications.

Career Highlights

Throughout his career, Masahiko Nagahama has worked with notable companies, including The Yokohama Rubber Co., Ltd. and Takata Corporation. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking projects.

Collaborations

Masahiko has collaborated with talented individuals such as Hirohiko Takaoka and Hideyo Asabuki. These partnerships have fostered innovation and creativity in his work.

Conclusion

Masahiko Nagahama is a distinguished inventor whose contributions to speed measurement technology continue to influence the industry. His dedication to innovation and collaboration has established him as a key figure in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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