Masaharu Sasaki

Title: Masaharu Sasaki: Semiconductor Manufacturing and Inspection Innovations.

Introduction

Masaharu Sasaki is an inventor associated with Okuchi, Japan, and Yamaha Corporation. His patent work addresses semiconductor wafer inspection, cutting, and manufacturing processes. His record includes 2 patents.

Latest Patents

Sasaki’s listed patents include “Method and Apparatus for Reading Identification Mark on Surface of Wafer.” The invention uses infrared illumination from the wafer’s backside to capture an image of an identification mark on its surface, even when the wafer is covered by a resin layer. The arrangement directs reflected infrared rays toward an image pickup device, and a polarizer may be used to improve image capture.

His other listed patent is “Semiconductor Device, Semiconductor Wafer, Chip Size Package, and Methods of Manufacturing and Inspection Therefor.” It describes patterns placed near wafer scribing lines to measure cutting width and positional shift. The patent also discusses forming a wider channel on the wafer’s backside to help reduce chipping, cracks, and burrs during cutting.

Career Highlights

Sasaki’s listed inventions focus on practical challenges in semiconductor production, including reading wafer identification marks and improving the precision and quality of wafer cutting. His work is associated with Yamaha Corporation.

Collaborations

Masayoshi Omura and Harumitsu Fujita are identified as Sasaki’s coworkers. The available information does not specify their roles in the listed patents.

Conclusion

Masaharu Sasaki’s patent portfolio reflects contributions to semiconductor inspection and manufacturing, with particular attention to reliable identification and cleaner wafer cutting.