Saitama, Japan

Masaaki Seki

This inventor holds 1 USPTO granted patent. Top assignee: Icst Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masaaki Seki. Retrieved from https://idiyas.com/inventor/masaaki-seki-0xwksvmo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Masaaki Seki and His Diagnostic Testing Invention.

Introduction

Masaaki Seki is an inventor based in Saitama, Japan. His patent work includes an immunochromatographic test device designed to assess two antibody-related results from a single specimen.

Latest Patents

Seki’s listed patent is “Test Device, Test Kit, and Test Method.” The invention describes a case with a specimen-dropping window and a detection window, containing a test piece with two detection portions and a shared specimen-dropping area. After a specimen is applied, it migrates to both detection portions. One portion traps a complex involving a labeled body and an antibody associated with vaccination or infection by a specified virus, while the other traps a complex involving a labeled body and an antibody associated with infection by that virus. Both results can be viewed through the detection window and assessed in parallel. Seki is listed with 1 patent.

Career Highlights

Seki is associated with Icst Corporation. His listed invention focuses on enabling simultaneous visual assessment of two antibody-related test results using one specimen.

Collaborations

The available information identifies Icst Corporation as Seki’s company affiliation. It does not specify additional collaborators or research partners.

Conclusion

Masaaki Seki’s listed patent presents a dual-detection immunochromatographic approach intended to provide parallel results from a single specimen.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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