This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Amiquam Sa. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Marvin A. Spurek and Non-Destructive Testing in Additive Manufacturing.
Introduction
Marvin A. Spurek is an inventor associated with Zürich, Switzerland, and Amiquam SA. His patent work concerns monitoring metal components during additive manufacturing, with a focus on detecting potential defects in areas identified as especially important.
Latest Patents
The supplied information lists one patent for Spurek: “Method for Non-Destructive Testing of Regions of Interest of a Metal Piece During Additive Manufacturing.” The method creates a three-dimensional digital model of a metal piece and uses software-based design rules to identify regions where defects are more likely to occur. Non-destructive testing sensors are then selected or positioned according to those regions, allowing them to collect quality-related data from the relevant areas while the piece is being manufactured. The patent also describes a system configured to carry out the method. Spurek’s listed portfolio comprises 1 patent.
Career Highlights
Spurek’s listed invention addresses a challenge in additive manufacturing: inspecting a metal component during production without relying on uniform sensor coverage across the entire piece. By directing sensors toward model-identified regions of interest, the method aims to focus monitoring on areas with a greater likelihood of defects. The supplied information associates Spurek with Amiquam SA.
Collaborations
The supplied information names Adriaan B. Spierings and Bernard Revaz as Spurek’s coworkers. Their inclusion indicates professional associations, but no specific joint patent or collaborative project is identified in the provided details.
Conclusion
Marvin A. Spurek’s listed patent applies model-guided, non-destructive testing to additive manufacturing, using targeted sensor placement or activation to monitor regions of a metal piece where defects may be more likely.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile