Biberbach, Germany

Martin Zeh

This inventor holds 1 USPTO granted patent. Top assignee: Texmag Gmbh Vertriebsgesellschaft. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Martin Zeh. Retrieved from https://idiyas.com/inventor/martin-zeh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Martin Zeh - Innovator in Material Sensing Technology

Introduction

Martin Zeh is a notable inventor based in Biberbach, Germany. He has made significant contributions to the field of material sensing technology. His innovative approach has led to the development of a unique method for sensing markings on running webs of material.

Latest Patents

Martin Zeh holds a patent for a "Method for sensing a marking on a running web of material." This method involves optically scanning the web of material using an image recording device. The process generates image signals in successive measuring cycles, which are then processed by an image processing device. This device determines the positional values of the marking on the web of material. A validity signal is produced from these positional values by applying a position-dependent weighting function, indicating whether the determined positional value is valid.

Career Highlights

Martin Zeh is associated with Texmag GmbH Vertriebsgesellschaft, where he applies his expertise in material sensing technology. His work has been instrumental in advancing the capabilities of the company in this specialized field.

Collaborations

Some of Martin's coworkers include Andrea Wittmann and Juergen Eisen, who contribute to the innovative environment at Texmag GmbH.

Conclusion

Martin Zeh's contributions to material sensing technology exemplify the impact of innovation in industrial applications. His patent reflects a commitment to enhancing the accuracy and reliability of material processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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