Costa Mesa, CA, United States of America

Martin L Sklena

This inventor holds 1 USPTO granted patent. Top assignee: Gti. Active years: 1976.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Martin L Sklena. Retrieved from https://idiyas.com/inventor/martin-l-sklena

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1976

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1 patent (USPTO):Explore Patents

Title: Martin L Sklena: Innovator in Component Handling Technology

Introduction

Martin L Sklena is a notable inventor based in Costa Mesa, California. He has made significant contributions to the field of component handling technology. His innovative approach has led to the development of a unique patent that enhances the efficiency of component testing operations.

Latest Patents

Sklena holds a patent for a "Component handler with fluid controlled memory." This invention features a holder designed to secure components during testing or other operations. The body of the handler contains multiple passages, with movable members that can shift from a first position to a second position. A mechanism provides fluid under pressure to facilitate this movement, which can be controlled based on the results of the tests performed on the components.

Career Highlights

Throughout his career, Martin L Sklena has worked with various professionals in the field. He is currently associated with Gti, where he continues to innovate and develop new technologies. His work has been instrumental in advancing component handling systems.

Collaborations

Some of his notable coworkers include Russell P Balent and Phillip E Greer. Their collaborative efforts have contributed to the success of various projects within the company.

Conclusion

Martin L Sklena's contributions to component handling technology exemplify the spirit of innovation. His patent reflects a commitment to improving operational efficiency in testing environments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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