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For the Inventor, By the Inventor

Zurich, Switzerland

Martin Heller

This inventor holds 4 USPTO granted patents. Top assignee: Gretag Imaging Ag. Active years: 1997-2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Martin Heller. Retrieved from https://idiyas.com/inventor/martin-heller-m9k70nde

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4

% Patents Active = 100.0

Average Co-Inventor Count = 1.8

ph-index = 1

Forward Citations = 3(Granted Patents)


Location History:

  • Zurich, CH (1997 - 2000)
  • Zürich, CH (2001)

Company Filing History:

goldMedal4 out of 48 
 
Gretag Imaging Ag
 patents

Years Active: 1997-2001

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4 patents (USPTO):Explore Patents
1. 6202527 - Cutting arrangement for a material web (2001-03-20),
2. 6163362 - Photo lab with transport arrangement (2000-12-19),
3. 6059465 - Test material storage and feed device (2000-05-09),
4. 5661541 - Photographic copying apparatus (1997-08-26),

Title: Martin Heller - Innovative Inventor from Zurich

Introduction: Martin Heller is a renowned inventor hailing from Zurich, Switzerland, known for his groundbreaking contributions to various fields of technology and science.

Latest Patents: Martin Heller's latest patents include advancements in renewable energy technologies, sustainable materials, and cutting-edge medical devices.

Career Highlights: Throughout his illustrious career, Martin Heller has received numerous awards for his innovative inventions, including the prestigious Inventor of the Year accolade in Switzerland.

Collaborations: Martin Heller has collaborated with leading research institutions, universities, and companies worldwide to further develop and implement his revolutionary ideas.

Conclusion: Martin Heller's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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