Dolni Redice, Czechia

Martin Dusek

This inventor holds 1 USPTO granted patent. Top assignee: Semiconductor Components Industries, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Martin Dusek. Retrieved from https://idiyas.com/inventor/martin-dusek

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Martin Dusek: Inventor in Converter Circuit Technology.

Introduction

Martin Dusek is an inventor associated with Dolni Redice, Czech Republic, and Semiconductor Components Industries, LLC. His patent work addresses converter circuit design and current regulation.

Latest Patents

Dusek is associated with 1 patent, titled “Converter Circuit and Control Method Thereof.” The invention concerns converter circuits that use average current feedback to regulate the current supplied to a load. Because non-ideal device behavior can make average-current sensing inaccurate, the disclosed methods improve measurement accuracy by disregarding selected portions of a pulse-width modulation (PWM) cycle. These portions may be identified using a peak threshold for rising current and a valley threshold for falling current. Adjusting the thresholds can help control both the average current and the converter’s switching frequency.

Career Highlights

The available information connects Dusek’s patent activity with Semiconductor Components Industries, LLC. His disclosed work focuses on improving current sensing and regulation in converter circuits.

Collaborations

Pavel Horsky and Jan Plojhar are identified as Dusek’s coworkers. The available information does not specify their roles in the patent.

Conclusion

Martin Dusek’s patent highlights a practical approach to improving average-current sensing in converter circuits through selective PWM-cycle measurement and adjustable thresholds.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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