Juelich, Germany

Martin Althaus

This inventor holds 1 USPTO granted patent. Top assignee: Forschungszentrum Julich Gmbh. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Martin Althaus. Retrieved from https://idiyas.com/inventor/martin-althaus-4cd9uqmm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Martin Althaus: Innovator in Crystal Technology

Introduction

Martin Althaus is a notable inventor based in Juelich, Germany. He has made significant contributions to the field of crystal technology, particularly through his innovative methods and apparatus for obtaining fissure-free crystals. His work is essential for various applications in materials science and engineering.

Latest Patents

Martin Althaus holds a patent for a "Method of and apparatus for obtaining fissure-free crystals." This patent showcases his expertise and dedication to advancing the technology in this area. He has successfully developed a solution that addresses common challenges in crystal production.

Career Highlights

Althaus is affiliated with Forschungszentrum Jülich GmbH, a prominent research center in Germany. His role at this institution allows him to collaborate with other experts and contribute to groundbreaking research. His career is marked by a commitment to innovation and excellence in his field.

Collaborations

Throughout his career, Martin has worked alongside esteemed colleagues such as Klaus Sonnenberg and Eckhard Kussel. These collaborations have further enriched his research and have led to advancements in crystal technology.

Conclusion

Martin Althaus is a distinguished inventor whose work in obtaining fissure-free crystals has made a significant impact in the field. His contributions continue to inspire future innovations in materials science.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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