Dallas, TX, United States of America

Martin Alan Franz

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Cornami, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Martin Alan Franz. Retrieved from https://idiyas.com/inventor/martin-alan-franz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Martin Alan Franz: Inventor of Fault-Tolerant Processor Layouts

Introduction

Martin Alan Franz is an inventor associated with Cornami, Inc. in Dallas, Texas. His patent work addresses fault tolerance in massively parallel processing arrays, where a system must continue operating despite defective processing cores. Franz is credited with 1 patent.

Latest Patents

Franz’s patent, “Method and System for Providing Fault Tolerant Layout of Massively Parallel Processing Array,” describes a way to create a robust arrangement of cores in a grid. The method uses information about defective cores and an ideal core layout to identify whether a defect affects the planned configuration. When a defective core is found, its functions can be reassigned to neighboring cores in the same row or column, helping preserve the intended processing topology.

Career Highlights

Franz’s disclosed invention focuses on maintaining a functional processing layout when one or more cores are defective. By adapting the assignment of core functions, the approach aims to support reliable operation in large-scale parallel computing systems.

Collaborations

Franz is associated with Cornami, Inc. His coworker, Muthiah Annamalai, is also identified in the information provided.

Conclusion

Martin Alan Franz’s patent presents a fault-tolerant approach to arranging and assigning work across processor cores, helping a massively parallel array accommodate defective components.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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