Foxborough, MA, United States of America

Marlene Shi

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Siemens Healthcare Diagnostics Gmbh. Active years: 2020-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marlene Shi. Retrieved from https://idiyas.com/inventor/marlene-shi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020-2022

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2 patents (USPTO):Explore Patents

Title: Marlene Shi: Innovator in Sensor Technology

Introduction

Marlene Shi is a prominent inventor based in Foxboro, MA (US). She has made significant contributions to the field of sensor technology, holding 2 patents to her name. Her work is characterized by innovative designs and practical applications that enhance diagnostic capabilities.

Latest Patents

Marlene's latest patents include a groundbreaking sensor array. In various illustrative embodiments, these test devices are described with opposing sensor arrays and same side contacts. This innovative approach aims to improve the efficiency and accuracy of diagnostic testing.

Career Highlights

Marlene Shi is currently employed at Siemens Healthcare Diagnostics GmbH, where she continues to push the boundaries of technology in healthcare diagnostics. Her role involves developing advanced sensor technologies that are crucial for modern medical applications.

Collaborations

Marlene has collaborated with talented professionals such as Jennifer A. Samproni and Todd Andrade. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Marlene Shi's contributions to sensor technology exemplify her dedication to advancing healthcare diagnostics. Her innovative patents and collaborative spirit position her as a key figure in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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