Munich, Germany

Markus Woischnik

This inventor holds 1 USPTO granted patent. Top assignee: Definiens Ag. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Markus Woischnik. Retrieved from https://idiyas.com/inventor/markus-woischnik-8br0k8wa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Markus Woischnik: Patent Inventor in Semantic Text Search

Introduction

Markus Woischnik is an inventor associated with Munich, Germany, and Definiens AG. His patent work includes a computerized approach to searching text documents using semantic language processing.

Latest Patents

Woischnik is associated with 1 patent: “Computerized Method and System for Searching for Text Passages in Text Documents.” The invention describes a method that transforms both target passages and document text into semantic network structures using surface-syntactic and deep-syntactic information. It then processes those structures using contextual information to improve their accuracy and links their nodes to a pre-existing ontology representing concepts in a language. This combination of prediction-based and ontology-based processing is intended to support more accurate searches for passages by meaning.

Career Highlights

Woischnik’s listed patent reflects work on applying computational linguistics and ontologies to information retrieval. The available information associates him with Definiens AG.

Collaborations

Dean Jones and Richard Hudson are identified as Woischnik’s coworkers. The provided information does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Markus Woischnik’s patent describes a semantic approach to text search that combines syntactic analysis, contextual processing, and ontology-based classification.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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