Emmen, Switzerland

Markus Thalmann

This inventor holds 1 USPTO granted patent. Top assignee: Rhodia Filtec Ag. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Markus Thalmann. Retrieved from https://idiyas.com/inventor/markus-thalmann

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Innovations by Inventor Markus Thalmann

Introduction

Markus Thalmann is a notable inventor based in Emmen, Switzerland. He has made significant contributions to the field of textile technology, particularly in the detection of structural faults in moving flat textile materials. His innovative approach has led to the development of a unique device that enhances quality control in textile manufacturing.

Latest Patents

Thalmann holds a patent for a "Process and device for detecting structural faults of moving flat." This invention features a spade-like leaf spring contact sensor designed to detect irregularities in the thread pattern of textile materials. The sensor is equipped with a mounting device that allows it to be positioned at an optimal angle for effective engagement with the threads. The device measures both regular and irregular deflections of the sensor, providing valuable data for analyzing structural faults.

Career Highlights

Markus Thalmann is associated with Rhodia Filtec AG, a company known for its advancements in textile technology. His work at the company has focused on improving the efficiency and accuracy of fault detection in textile production processes. Thalmann's innovative solutions have contributed to enhancing product quality and reducing waste in the industry.

Conclusion

Markus Thalmann's contributions to textile technology through his innovative patent demonstrate his commitment to improving manufacturing processes. His work continues to influence the industry positively, ensuring higher standards in textile quality control.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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