Dachau, Germany

Markus Kolb

This inventor holds 1 USPTO granted patent. Top assignee: Mtu Aero Engines Ag. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Markus Kolb. Retrieved from https://idiyas.com/inventor/markus-kolb-ryso20eg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Markus Kolb in Component Classification

Introduction

Markus Kolb is an accomplished inventor based in Dachau, Germany. He has made significant contributions to the field of component classification through his innovative methods. His work focuses on enhancing the accuracy and efficiency of identifying defects in components.

Latest Patents

Markus Kolb holds a patent for a "Method for classifying an etch indication of a component." This method involves several steps, including providing a captured image of the etch indication, detecting criteria based on the image, comparing these criteria to a stored data set, and classifying the etch indication into predetermined defect classes. This innovative approach aims to streamline the defect classification process in various applications.

Career Highlights

Markus Kolb is currently employed at Mtu Aero Engines AG, where he applies his expertise in engineering and innovation. His work at the company has allowed him to develop and refine his patented methods, contributing to advancements in the aerospace industry.

Collaborations

Markus collaborates with talented colleagues, including Joachim Bamberg and Marco Hueller. Their combined efforts foster a creative environment that drives innovation and enhances the quality of their projects.

Conclusion

Markus Kolb's contributions to the field of component classification demonstrate his commitment to innovation and excellence. His patented method represents a significant advancement in the industry, showcasing the importance of effective defect classification.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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