KELL AM SEE, Germany

Markus Kahn

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Sap Se. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Markus Kahn. Retrieved from https://idiyas.com/inventor/markus-kahn-babycm9j

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Markus Kahn and Database Schema Innovation.

Introduction

Markus Kahn is an inventor based in Kell am See, Germany, associated with SAP SE. His patent work addresses database design and performance, focusing on ways to make data access more efficient.

Latest Patents

Kahn is credited with 1 patent: “Table Schema Providing Improved Database System Performance.” The invention describes a table schema that supports data denormalization, allowing database operations to access a single table instead of multiple tables. This approach can reduce the number and complexity of database operations.

The schema includes an attribute subset indicator field. Its values can correspond to different contexts, such as tables or views representing different entity types. A value can enable access to data at a broad level, while specifying additional attribute values can provide more detailed results. Different attribute subsets can be retrieved for each indicator value.

Career Highlights

Kahn’s listed invention reflects work on database architecture and the practical challenge of improving system performance through more direct data access. His patent is associated with SAP SE.

Collaborations

Kahn’s identified coworkers include Holger Wuest and Markus Riepp.

Conclusion

Markus Kahn’s patent presents a denormalized table-schema approach intended to simplify database operations and improve performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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