Markus Bartscher

Title: Biography of Inventor Markus Bartscher

Introduction

Markus Bartscher is a notable inventor based in Edemissen, Germany. He has made significant contributions to the field of computer tomography and dimensional measurement technologies. With a total of three patents to his name, Bartscher has demonstrated his expertise and innovation in these areas.

Latest Patents

His latest patents include a method for monitoring the functional state of a system for computer-tomographic examination of workpieces. This method involves conducting one or more computer-tomographic measurements on workpieces, resulting in measured values for various measurement variables. The functional state of the system is determined by comparing the degrees of variation of these measured values with reference degrees of variation. Another significant patent is for a method of dimensional x-ray measurement, particularly through computed tomography. This invention outlines a process that includes irradiating a test object with non-monochromatic X-ray radiation and measuring the intensity of the radiation to calculate dimensions of the test object.

Career Highlights

Throughout his career, Markus Bartscher has worked with prominent organizations such as Volume Graphics GmbH and the Federal Republic of Germany, represented by the Federal Ministry for Economic Affairs and Energy. His work has contributed to advancements in the field of x-ray computed tomography and measurement technologies.

Collaborations

Bartscher has collaborated with esteemed colleagues, including Thomas Günther and Christoph Poliwoda. These