The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Oct. 20, 2016
Volume Graphics Gmbh, Heidelberg, DE;
Physikalisch-technische Bundesanstalt, Braunschweig, DE;
Torsten Schönfeld, Braunschweig, DE;
Markus Bartscher, Edemissen, DE;
Thomas Günther, Heidelberg, DE;
Christoph Poliwoda, Heidelberg, DE;
Christof Reinhart, Heidelberg, DE;
Volume Graphics GmbH, Heidelberg, DE;
Abstract
Computer-implemented methods for monitoring the functional state of a system for the computer-tomographic examination of workpieces by carrying out one or more computer-tomographic measurements on the workpiece. The measurements each result here in at least one measured value for at least one measurement variable. The method for monitoring the functional state selects measured values for at least one measurement variable from at least two measurements on one or more workpieces. At least one degree of variation for the selected measured values of the at least one measurement variable as well as at least one reference degree of variation for measured values of the at least one measurement variable is determined. The functional state of the system is determined by comparing the at least one determined degree of variation with the at least one reference degree of variation for the at least one measurement variable.