Delafield, WI, United States of America

Mark Schultz

This inventor holds 1 USPTO granted patent. Top assignee: Deere & Company. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mark Schultz. Retrieved from https://idiyas.com/inventor/mark-schultz-bnpx4n1w

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2013

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Mark Schultz

Introduction

Mark Schultz is an accomplished inventor based in Delafield, Wisconsin. With a keen interest in hydraulic systems, he has made significant strides in the engineering domain through his innovative design and problem-solving abilities.

Latest Patents

Mark holds a patent for his invention titled "Differential Pressure Control." This invention encompasses a vehicle equipped with a load-sensing hydraulic control system, which greatly enhances the efficiency and responsiveness of hydraulic operations in vehicles.

Career Highlights

Mark Schultz is affiliated with Deere & Company, a prominent firm known for its sophisticated agricultural machinery and equipment. His work at this esteemed company reflects his commitment to advancing technology within the industry.

Collaborations

Throughout his career, Mark has collaborated with notable colleagues such as Eric P. Hamkins and Steve Gary Fleischmann. These partnerships have allowed him to combine diverse perspectives and skills, leading to a fruitful innovation environment.

Conclusion

Mark Schultz exemplifies the spirit of innovation through his contributions to hydraulic systems and machinery. His patent demonstrates his ability to solve real-world challenges while working alongside talented professionals, positioning him as a significant figure in the engineering and invention landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…