Worcester, MA, United States of America

Mark R Stevens

This inventor holds 1 USPTO granted patent. Top assignee: Hewlett-Packard Development Company, L.p.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mark R Stevens. Retrieved from https://idiyas.com/inventor/mark-r-stevens

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Mark R Stevens - Innovator in Color Consistency Measurement

Introduction

Mark R Stevens is an accomplished inventor based in Worcester, MA (US). He has made significant contributions to the field of image processing and three-dimensional modeling. His innovative approach to color consistency in images has paved the way for advancements in scene reconstruction.

Latest Patents

Stevens holds a patent for a method titled "Histogram-based color consistency measure for scene reconstruction." This patent describes a technique for testing color consistency between corresponding portions of two-dimensional images or photographs. The method utilizes histograms to determine whether color consistency exists. If color consistency is confirmed, the voxels or other modeling primitives viewed in the tested image portions are included in the three-dimensional model.

Career Highlights

Mark R Stevens is currently employed at Hewlett-Packard Development Company, L.P. His work at HP has allowed him to apply his expertise in image processing and contribute to the development of innovative technologies.

Collaborations

Stevens has collaborated with William Culbertson, enhancing the scope of his projects and contributing to the success of their joint efforts.

Conclusion

Mark R Stevens is a notable inventor whose work in color consistency measurement has had a significant impact on the field of three-dimensional modeling. His contributions continue to influence advancements in image processing technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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