Mark O Porter

Title: Mark O Porter: Innovator in LBIST Test Coverage

Introduction

Mark O Porter is a notable inventor based in Los Gatos, California. He has made significant contributions to the field of testing methodologies, particularly in the area of LBIST (Logic Built-In Self-Test). His innovative approach has led to the development of a unique system that enhances test coverage and observability in electronic systems.

Latest Patents

Mark O Porter holds a patent for a "System and method for improving LBIST test coverage." This invention focuses on the initialization process and structure of the system, ensuring that during the loading of random data, a 1-hot condition is maintained to prevent contention or a high current state. The invention improves the observability of intermediate stages by preventing random data from feeding state elements in scan chains that cannot tolerate such data. The system includes a PRPG (Pseudo-Random Pattern Generator) that generates random data for LBIST Random Scan Chains (LRSCs) while ensuring that LBIST Non-random Scan Chains (LNSCs) receive bit values from another scan chain.

Career Highlights

Mark O Porter is associated with Fujitsu Corporation, where he has been able to apply his expertise in electronic testing. His work has contributed to advancements in the reliability and efficiency of testing processes in electronic devices.

Collaborations

Throughout his career, Mark has collaborated with notable colleagues such as Dwight K Elvey and Paul Wong. These collaborations have further enriched his work and contributed to the development of innovative solutions in the field.

Conclusion

Mark O Porter is a distinguished inventor whose work in improving LBIST test coverage has made a significant impact in the electronics industry. His innovative patent reflects his commitment to enhancing testing methodologies, ensuring better performance and reliability in electronic systems.