Cary, IL, United States of America

Mark Notestine

This inventor holds 1 USPTO granted patent. Top assignee: Baxter International Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mark Notestine. Retrieved from https://idiyas.com/inventor/mark-notestine

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 298(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Mark Notestine: Innovator in Medical Device Verification

Introduction

Mark Notestine is a notable inventor based in Cary, IL (US). He has made significant contributions to the field of medical devices, particularly in the area of operational parameter verification. His work is essential for ensuring the reliability and safety of medical equipment.

Latest Patents

Mark Notestine holds a patent for a "System and method for verifying medical device operational parameters." This innovative system provides a method for executing a comparison of a medical device's operational parameters to an order, enhancing the accuracy and efficiency of medical device operations. He has 1 patent to his name.

Career Highlights

Mark Notestine is currently employed at Baxter International Inc., a leading company in the healthcare sector. His role at Baxter allows him to apply his expertise in medical device technology and contribute to advancements in patient care.

Collaborations

Throughout his career, Mark has collaborated with talented professionals, including James P Martucci and Laura M Letellier. These collaborations have fostered innovation and development in the medical device industry.

Conclusion

Mark Notestine's contributions to medical device verification exemplify the importance of innovation in healthcare. His work not only enhances the functionality of medical devices but also ensures patient safety and care quality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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