West Lafayette, IN, United States of America

Mark Gildersleeve

This inventor holds 1 USPTO granted patent. Top assignee: Teledyne Flir Detection, Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mark Gildersleeve. Retrieved from https://idiyas.com/inventor/mark-gildersleeve-clrhxjxv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Mark Gildersleeve: Innovator in Electron Source Technology

Introduction

Mark Gildersleeve is a notable inventor based in West Lafayette, IN (US). He has made significant contributions to the field of electron source technology. His work focuses on devices and methods that generate electrons for various applications, including spectroscopy.

Latest Patents

Mark Gildersleeve holds a patent for "Electron source devices, electron source assemblies, and methods for generating electrons." This patent outlines innovative approaches to generating electrons that can facilitate spectroscopy, such as mass spectrometry, including mass selection or ion mobility. He has 1 patent to his name.

Career Highlights

Gildersleeve is currently employed at Teledyne FLIR Detection, Inc., where he continues to develop advanced technologies in electron sources. His expertise in this area has positioned him as a valuable asset to his company and the broader scientific community.

Collaborations

Throughout his career, Mark has collaborated with talented individuals such as James Mitchell Wells and Douglas K Martins. These partnerships have contributed to the advancement of his research and innovations.

Conclusion

Mark Gildersleeve's work in electron source technology exemplifies the impact of innovative thinking in scientific research. His contributions continue to influence the field and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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