Penfield, NY, United States of America

Mark F Enzien


Average Co-Inventor Count = 1.8

ph-index = 1

Forward Citations = 81(Granted Patents)


Company Filing History:


Years Active: 1993-2015

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4 patents (USPTO):Explore Patents

Title: Mark F Enzien: Innovator in Counterfeit Deterrence Technology

Introduction

Mark F Enzien is a notable inventor based in Penfield, NY (US). He has made significant contributions to the field of printing technology, particularly in counterfeit deterrence. With a total of 4 patents to his name, Enzien's work has had a substantial impact on the industry.

Latest Patents

One of Enzien's latest patents focuses on counterfeit deterrence using full-width array scans. This innovative system and method facilitate the detection of counterfeit signatures in printed images. The process involves scanning a final image from a photoreceptor belt before or after transferring the image to a print medium. The scanned image data is then assessed using a set of stored criteria to identify any restricted images. If a counterfeit image is detected, the printer can be shut down, electronically locked until serviced, or programmed to damage or mark the printed counterfeit images.

Career Highlights

Mark F Enzien is currently employed at Xerox Corporation, a leading company in the printing and imaging industry. His work at Xerox has allowed him to develop and refine technologies that enhance the security and integrity of printed materials.

Collaborations

Enzien has collaborated with several talented individuals throughout his career, including Gregg A Bonikowski and Jaoude F Aboujaoude. These collaborations have contributed to the advancement of innovative solutions in the field of printing technology.

Conclusion

Mark F Enzien's contributions to counterfeit deterrence technology exemplify his commitment to innovation in the printing industry. His patents and work at Xerox Corporation continue to influence the way counterfeit images are detected and managed.

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