Milton, VT, United States of America

Mark E Beaulieu

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mark E Beaulieu. Retrieved from https://idiyas.com/inventor/mark-e-beaulieu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Mark E Beaulieu: Innovator in Environmental Monitoring Systems

Introduction

Mark E Beaulieu is a notable inventor based in Milton, VT (US). He has made significant contributions to the field of manufacturing through his innovative patent. His work focuses on enhancing the monitoring of environments surrounding products during their manufacture.

Latest Patents

Mark E Beaulieu holds a patent for a "Manufacturing product carrier environment and event monitoring system." This invention is an apparatus, method, and system designed to monitor the environment surrounding a product in a product carrier. It also tracks events affecting both the product carrier and the product during the manufacturing process. The apparatus includes a product carrier adapted to transport products undergoing manufacture and a device that senses attributes of the environment within the product carrier or events affecting it.

Career Highlights

Mark is associated with International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to leverage his expertise in developing innovative solutions that improve manufacturing processes.

Collaborations

Some of his notable coworkers include James A Bostwick and Scott A Cummings. Their collaboration contributes to the innovative environment at IBM, fostering advancements in technology and manufacturing.

Conclusion

Mark E Beaulieu's contributions to environmental monitoring systems in manufacturing highlight his role as an innovator in the industry. His patent reflects a commitment to improving product safety and quality during the manufacturing process.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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