Ardrossan, Canada

Mark Dubbeldam

This inventor holds 0 USPTO granted patents, plus 3 CIPO patents.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mark Dubbeldam. Retrieved from https://idiyas.com/inventor/mark-dubbeldam-3f9u3png

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Title: Mark Dubbeldam: Innovator in Ultrasonic Sensor Technology

Introduction

Mark Dubbeldam is an inventor based in Ardrossan, Canada. He has made significant contributions to the field of non-destructive evaluation through his innovative methods and apparatuses. His work primarily focuses on the use of ultrasonic sensors for assessing the integrity of tubular structures.

Latest Patents

Mark Dubbeldam holds a patent for a "Method and Apparatus for Conveying an Ultrasonic Sensor About an Outer Peripheral Surface of a Tube." This invention involves a method for moving an ultrasonic sensor along the outer surface of a tube to perform non-destructive evaluations. The ultrasonic sensor is mounted on a flexible tension link, which allows it to maintain contact with the tube while moving circumferentially around it.

Career Highlights

Throughout his career, Mark has worked with notable companies such as Jireh Industries Ltd. and Metalogic Inspection Services Inc. His experience in these organizations has contributed to his expertise in ultrasonic technology and non-destructive testing methods.

Collaborations

Mark has collaborated with professionals like Arthur J. Dubbeldam and Jason Wiebe. These partnerships have likely enhanced his work and contributed to the development of innovative solutions in his field.

Conclusion

Mark Dubbeldam is a dedicated inventor whose work in ultrasonic sensor technology has the potential to advance non-destructive evaluation methods. His contributions reflect a commitment to innovation and excellence in engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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