Halifax, Canada

Mark D McKenna


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Mark D McKenna: Innovator in Software Dependency Resolution

Introduction

Mark D McKenna is a notable inventor based in Halifax, Canada. He has made significant contributions to the field of software systems, particularly in resolving interdependencies between heterogeneous artifacts. His innovative approach has led to the development of a patented method that enhances the efficiency and effectiveness of software systems.

Latest Patents

Mark D McKenna holds a patent for "Resolving interdependencies between heterogeneous artifacts in a software system." This invention provides an improved solution for identifying and managing dependencies within software systems. The method involves obtaining an input resource with multiple entry points and at least one strategy, identifying artifacts for each entry point, and determining dependencies among the gathered artifacts. The output resource includes the identified dependencies, facilitating better management of software components.

Career Highlights

Mark D McKenna is associated with International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to collaborate with leading experts in the field and contribute to groundbreaking advancements in software technology. His innovative solutions have garnered attention and recognition within the industry.

Collaborations

Some of Mark's coworkers include Jennifer L Hawkins and Darshanand Khusial. Their collaborative efforts have played a crucial role in advancing the projects they work on together, fostering an environment of innovation and creativity.

Conclusion

Mark D McKenna's contributions to software dependency resolution exemplify the impact of innovation in technology. His patented methods not only enhance software systems but also pave the way for future advancements in the field.

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