Colchester, VT, United States of America

Mark D Jacunski


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Mark D Jacunski: Innovator in On-Chip Reliability Monitoring

Introduction

Mark D Jacunski is a notable inventor based in Colchester, Vermont, who has made significant contributions to the field of on-chip reliability monitoring. With a focus on enhancing the performance and longevity of functional devices, Jacunski's work is pivotal in the realm of semiconductor technology.

Latest Patents

Jacunski holds a patent for an innovative invention titled "On-chip reliability monitor and method." This patent describes a sophisticated monitor that includes a test circuit with a test device, a reference circuit with a reference device, and a comparator circuit. The monitor operates by periodically switching between stress and test modes. During the stress mode, the test device is subjected to conditions that mimic the operational environment of an on-chip functional device, while the reference device remains unstressed. In the test mode, the comparator circuit evaluates a parameter of the test device against that of the reference device, generating a status signal based on the observed differences. This status signal serves as an indicator of the functional device's exposure to a predetermined number of power-on hours. Additionally, the design allows for multiple monitors to be cascaded, providing a more comprehensive assessment of stress-induced changes over time. Jacunski's patent is a testament to his innovative approach to reliability in semiconductor devices.

Career Highlights

Mark D Jacunski is currently associated with Marvell Asia Pte., Ltd., where he continues to push the boundaries of technology. His work at Marvell has allowed him to collaborate with other talented professionals in the field, contributing to advancements in semiconductor reliability.

Collaborations

Jacunski has worked alongside notable colleagues such as John Atkinson Fifield and Eric D Hunt-Schroeder. These collaborations have fostered an environment of innovation and creativity, leading to significant advancements in their respective fields.

Conclusion

Mark D Jacunski's contributions to on-chip reliability monitoring exemplify the spirit of innovation in technology. His patent and ongoing work at Marvell Asia Pte., Ltd. highlight his commitment to enhancing the reliability of semiconductor devices. Jacunski's efforts are paving the way for future advancements in the industry.

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