This inventor holds 1 USPTO granted patent. Top assignee: Applied Precision, Inc.. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006
Title: Mark D. Cavelero and Scanning-System Calibration.
Introduction
Mark D. Cavelero is an inventor associated with Everett, Washington, and Applied Precision, Inc. His patent work addresses improving the accuracy of scanning systems by correcting alignment errors.
Latest Patents
Cavelero is credited with 1 patent: “Coordinate Calibration for Scanning Systems.” The invention uses a reference slide or data point to collect measurements, compares those measurements with expected results, and identifies systematic alignment errors. A model then corrects the errors during scanning, producing more accurate scans that can be assembled into a complete image of the scan area.
Career Highlights
Cavelero’s documented patent contribution focuses on calibration methods for scanning systems. The available information associates his work with Applied Precision, Inc.
Collaborations
Cavelero’s listed coworkers include Ray H. Kraft and Carl S. Brown. Their names provide context for the professional environment associated with his work.
Conclusion
Mark D. Cavelero’s patent describes a practical approach to improving scan accuracy by detecting and correcting systematic alignment errors.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile