Mark C Lee

Title: Mark C Lee: Innovator in Microshell Technology and Noncontact Temperature Measurement

Introduction

Mark C Lee is a distinguished inventor based in La Canada, CA (US), known for his significant contributions to the fields of microshell technology and noncontact temperature measurement. With a total of 10 patents to his name, Lee has made remarkable advancements that have practical applications in various industries.

Latest Patents

One of Lee's latest patents is a method and apparatus for producing microshells. This innovative method involves forming hollow particles of extremely small size by heating shell material to a molten temperature in the presence of a gas that is moderately soluble in the shell material. The process results in the formation of gas-filled shells with a small wall thickness compared to their diameter. Another notable patent is a noncontact temperature pattern measuring device that utilizes laser pyrometer techniques. This device accurately images temperature distributions on a target without physical contact, employing a high-definition laser beam and photodetector to focus on precise localized points.

Career Highlights

Throughout his career, Mark C Lee has worked with esteemed organizations, including the United States of America as represented by the Administrator and the California Institute of Technology. His work has significantly impacted the development of advanced measurement techniques and materials science.

Collaborations

Lee has collaborated with notable individuals in his field, including Taylor G Wang and Daniel D Elleman. Their combined expertise has contributed to the successful development of innovative technologies.

Conclusion

Mark C Lee's contributions to innovation in microshell technology and noncontact temperature measurement highlight his role as a leading inventor. His patents reflect a commitment to advancing technology and improving measurement techniques across various applications.