Binghamton, NY, United States of America

Mark A West

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1987.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mark A West. Retrieved from https://idiyas.com/inventor/mark-a-west-a4rmdjrh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 45(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: **Mark A. West: Innovating Measurement of Printed Circuit Defects**

Introduction

Mark A. West, an inventor based in Binghamton, NY, has made significant contributions to the field of electronic measurement. He holds a patent that addresses critical challenges in the detection of defects in printed circuit wiring. With a background in innovation at International Business Machines Corporation (IBM), his work demonstrates a blend of creativity and technical expertise.

Latest Patents

Mark A. West is the proud inventor of a patented system designed for measuring and detecting printed circuit wiring defects. This innovative non-contact system efficiently identifies defects and measures the height of circuit features in relation to the substrate. The system incorporates an energy source that illuminates both the substrate and circuit features, alongside a scanner that retrieves reflected energy. This reflected energy generates a signal that varies in intensity, enabling accurate measurement that takes into account any variations or non-uniformities caused by substrate bending or warpage.

Career Highlights

Throughout his career, Mark A. West has thrived in the intellectually stimulating environment of IBM, where he engages in developing cutting-edge solutions. His technical acumen has contributed to enhancing quality assurance processes in the electronics manufacturing sector, ensuring reliability and performance of printed circuit boards.

Collaborations

Mark has had the opportunity to collaborate with talented individuals such as Robert M. Crabb and Steven M. DeFoster. Together, they contribute to the innovative spirit at IBM, supporting one another in research and development projects aimed at revolutionizing electronic measurement techniques.

Conclusion

Mark A. West exemplifies the innovative spirit that drives advancements in technology. His patent for a system that detects printed circuit wiring defects represents a significant leap in ensuring the quality and reliability of electronic components. As he continues to work with esteemed colleagues at IBM, we can expect further contributions from him in the realm of innovations and inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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