Location History:
- Indianapolis, IN (US) (1987)
- Kent, WA (US) (1998 - 2010)
Company Filing History:
Years Active: 1987-2010
Title: Mark A Lee: Innovator in Image Processing and Ultrasonic Inspection
Introduction
Mark A Lee is a distinguished inventor based in Kent, WA (US), known for his contributions to image processing and ultrasonic inspection technologies. With a total of 10 patents to his name, Lee has made significant advancements in methods that enhance the quality and efficiency of digital imaging and structural inspections.
Latest Patents
Among his latest patents, Lee has developed a "System and method for comparing images with different contrast levels." This innovative system provides methods for automatically adjusting the brightness of digital images. The process involves accessing data from a first digital image, identifying text and background elements, and calculating an average pixel value that excludes these elements. The brightness setting of the image is then adjusted based on this calculated value.
Another notable patent is for "Integrated ultrasonic inspection probes, systems, and methods for inspection of composite assemblies." This invention allows for the inspection of uniquely shaped structures, such as fuselage frames and shear ties. The apparatus and systems enable both manual inspection and the use of a portable function support system, which delivers fluid couplant and controls the inspection sensors. This technology facilitates fast and efficient custom inspection devices for challenging structures.
Career Highlights
Mark A Lee has had a notable career, working with prominent companies such as The Boeing Company. His work has significantly impacted the fields of imaging and inspection, showcasing his ability to innovate and solve complex problems.
Collaborations
Throughout his career, Lee has collaborated with talented individuals, including Michael J Duncan and Fred D Young. These partnerships have contributed to the development of his groundbreaking technologies.
Conclusion
Mark A Lee's contributions to image processing and ultrasonic inspection demonstrate his innovative spirit and technical expertise. His patents reflect a commitment to advancing technology in ways that enhance efficiency and effectiveness in various applications.