The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2010
Filed:
Nov. 03, 2008
Integrated ultrasonic inspection probes, systems, and methods for inspection of composite assemblies
Hien T. Bui, Auburn, WA (US);
Fred D. Young, Bellevue, WA (US);
Mark A. Lee, Kent, WA (US);
Richard C. Krotzer, Enumclaw, WA (US);
Clyde T. Uyehara, Kent, WA (US);
Barry A. Fetzer, Renton, WA (US);
Hien T. Bui, Auburn, WA (US);
Fred D. Young, Bellevue, WA (US);
Mark A. Lee, Kent, WA (US);
Richard C. Krotzer, Enumclaw, WA (US);
Clyde T. Uyehara, Kent, WA (US);
Barry A. Fetzer, Renton, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Apparatus, systems, and methods for inspecting a structure are provided which permit inspection of uniquely shaped structures such as fuselage frames and shear ties. Probes may be constructed from rapid prototyping. Inspection may be performed manually and may use a portable function support system for delivering fluid couplant, controlling transmit and receive functions of the inspection sensors, and delivering immediate visual analysis for an operator. Integrated ultrasonic inspection apparatus, systems, and methods facilitate fast and efficient custom inspection devices and inspecting otherwise difficult-to-inspect structures.