Everett, WA, United States of America

Mark A Holton

This inventor holds 2 USPTO granted patents. Top assignee: Microvision, Inc.. Active years: 2007.


% Patents Active = 100.0

Average Co-Inventor Count = 7.5

ph-index = 2

Forward Citations = 105(Granted Patents)


Company Filing History:


Years Active: 2007

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2 patents (USPTO):Explore Patents

Title: Mark A Holton: Innovator in Light Source Technology

Introduction

Mark A Holton is a notable inventor based in Everett, WA (US). He has made significant contributions to the field of light source technology, holding 2 patents that showcase his innovative approach to utilizing non-ideal light sources.

Latest Patents

One of Holton's latest patents is titled "Apparatuses and methods for utilizing non-ideal light sources." This method involves obtaining a measurement of a property of a light source, scanning light from the light source onto a surface, and detecting light from the surface to create a picture element. The process includes correcting the picture element with the measurement of the property to ensure accuracy. Additionally, he has developed a "Scanned beam imager," which is adaptable for use in medical imaging applications. This apparatus is designed to enhance image capture through advanced scanning techniques.

Career Highlights

Mark A Holton is currently associated with Microvision, Inc., where he continues to push the boundaries of technology in light source applications. His work has been instrumental in developing innovative solutions that address challenges in imaging and display technologies.

Collaborations

Holton collaborates with talented individuals such as Christopher A Wiklof and Martin A Kykta, contributing to a dynamic team focused on advancing technology in their field.

Conclusion

Mark A Holton's contributions to light source technology through his patents and work at Microvision, Inc. highlight his role as an influential inventor. His innovative methods and apparatuses are paving the way for advancements in imaging applications.

Profile summary based on public USPTO records.
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