Osnabrueck, Germany

Marius Thiel

This inventor holds 4 USPTO granted patents and 1 published patent application, plus 1 CIPO patent and 7 EPO patents. Top assignee: Citex Holding Gmbh. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marius Thiel. Retrieved from https://idiyas.com/inventor/marius-thiel-3j1vfqzq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 4 

% Patents Active = 100.0


 

Average Co-Inventor Count = 1.1

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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4 patents (USPTO):Explore Patents

Title: Marius Thiel: Innovator in THz Measurement Technology

Introduction

Marius Thiel is a notable inventor based in Osnabrück, Germany. He has made significant contributions to the field of terahertz (THz) measurement technology. With a total of 4 patents to his name, Thiel's work focuses on innovative methods and devices for measuring transported objects using THz technology.

Latest Patents

Thiel's latest patents include a THz measuring device and a THz measuring method specifically designed for measuring extruded objects. The first patent details a THz measuring device that effectively measures a transported measuring object. The second patent outlines a THz measurement method that includes several steps for accurately measuring a designated object.

Career Highlights

Throughout his career, Marius Thiel has worked with several companies, including Citex Holding GmbH and Inoex GmbH, which specializes in innovations and equipment for extrusion technology. His experience in these organizations has allowed him to develop and refine his expertise in THz measurement technology.

Collaborations

Thiel has collaborated with various professionals in his field, including Ralph Klose, enhancing his work through shared knowledge and expertise.

Conclusion

Marius Thiel's contributions to THz measurement technology demonstrate his innovative spirit and commitment to advancing this specialized field. His patents and career achievements reflect his dedication to improving measurement methods and devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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