This inventor holds 1 USPTO granted patent. Top assignee: Delmic IP B.v.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Marit Rosa Smeets: Micromachining with Focused Ion Beams.
Introduction
Marit Rosa Smeets is an inventor associated with Delft, the Netherlands, and Delmic IP B.V. Her patent work addresses micromachining samples with a focused ion beam while monitoring them optically.
Latest Patents
Smeets is credited with 1 patent: “Method and Apparatus for Micromachining a Sample Using a Focused Ion Beam.” The invention combines a sample holder, a focused ion beam exposure system, and a light optical microscope. The microscope can image or monitor a sample during or after ion-beam exposure.
The method analyzes reflected or transmitted light and measures intensity modulation caused by optical interference between light from two sample surfaces. That measurement can be used to determine the distance between the surfaces, supporting observation and control during micromachining.
Career Highlights
Smeets’s listed patent highlights an approach that integrates focused ion beam processing with optical monitoring. This combination is designed to provide information about a sample’s surfaces while it is being processed.
Collaborations
Her listed coworkers include Daan Benjamin Boltje and Mart Guus Ferdinand Last. The patent information also associates her work with Delmic IP B.V.
Conclusion
Marit Rosa Smeets’s patent describes an integrated method for micromachining and optical measurement, bringing focused ion beam exposure and sample monitoring together in one system.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile