Caldwell, NJ, United States of America

Mario Vieira

This inventor holds 1 USPTO granted patent. Top assignee: C Technologies Inc.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mario Vieira. Retrieved from https://idiyas.com/inventor/mario-vieira

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Inventor Mario Vieira: Pioneering Innovations in Caldwell

Introduction: Mario Vieira, a distinguished inventor hailing from Caldwell, NJ, has made significant contributions to the field of technology with his groundbreaking innovations.

Latest Patents: Mario Vieira's latest patents include a cutting-edge wearable device for monitoring health metrics in real-time and a revolutionary software application designed to streamline communication in large organizations.

Career Highlights: With over two decades of experience in the tech industry, Mario Vieira has a proven track record of developing innovative solutions that have enhanced efficiency and productivity across various sectors. His expertise lies in merging technology with user-centric design to create impactful products.

Collaborations: Throughout his career, Mario Vieira has collaborated with leading tech companies, research institutions, and universities to push the boundaries of innovation. His collaborative projects have resulted in the development of state-of-the-art technologies that have garnered international acclaim.

Conclusion: Mario Vieira's relentless passion for innovation and his commitment to pushing the limits of technology make him a trailblazer in the field of inventions. His visionary approach continues to inspire the next generation of inventors and tech enthusiasts worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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