Vernon, CT, United States of America

Mario P Bochiecchio

This inventor holds 1 USPTO granted patent. Top assignee: United Technologies Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mario P Bochiecchio. Retrieved from https://idiyas.com/inventor/mario-p-bochiecchio

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: The Innovations of Mario P Bochiecchio

Introduction

Mario P Bochiecchio is an accomplished inventor based in Vernon, CT (US). He has made significant contributions to the field of rapid manufacturing. His innovative approach has led to the development of a unique manufacturing method that enhances efficiency and productivity.

Latest Patents

Mario holds a patent for a "Rapid manufacturing method." This method involves forming tooling in a rapid manufacturing process, where the tooling is coated with a conductive material. This innovation is aimed at improving the speed and effectiveness of manufacturing processes.

Career Highlights

Mario P Bochiecchio is associated with United Technologies Corporation, where he applies his expertise in manufacturing technologies. His work has been instrumental in advancing the company's capabilities in rapid manufacturing.

Collaborations

Throughout his career, Mario has collaborated with notable colleagues, including Lea Kennard Castle and John Joseph Marcin. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Mario P Bochiecchio's contributions to rapid manufacturing exemplify the spirit of innovation. His patent and work at United Technologies Corporation highlight his commitment to advancing manufacturing technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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