San Nicola La Strada, Italy

Mario Alghiri

This inventor holds 1 USPTO granted patent. Top assignee: Stmicroelectronics S.r.l.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mario Alghiri. Retrieved from https://idiyas.com/inventor/mario-alghiri

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Mario Alghiri: Integrated Circuit Card Testing Innovation

Introduction

Mario Alghiri is an inventor based in San Nicola La Strada, Italy, and is associated with STMicroelectronics S.r.l. His patent work addresses how test profiles can be modified and applied in integrated circuit cards.

Latest Patents

Alghiri is named on 1 patent: “Method for Modifying a Test Profile in an Integrated Circuit Card, Corresponding Integrated Circuit Card, Testing Method and Apparatus.” The invention describes an integrated circuit with memory and processing circuitry. The memory stores an Elementary File Test file containing information for updating a target elementary file. That information identifies the target file’s location and includes length indicators and data of two types. The processing circuitry uses the file path identifier to locate the target file and updates its content with the specified data.

Career Highlights

Alghiri’s listed patent reflects work on test-profile management for integrated circuit cards. The disclosed method organizes update information in a test file and enables processing circuitry to apply that information to a target file.

Collaborations

The patent information associates Alghiri with STMicroelectronics S.r.l., a company working in the semiconductor industry. The available details identify this professional association but do not specify additional collaborators.

Conclusion

Mario Alghiri’s patent focuses on a structured method for locating and updating files used in integrated circuit card testing, highlighting his contribution to test-profile technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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