Tokyo, Japan

Mariko Jinno

This inventor holds 6 USPTO granted patents. Top assignees: Nec Infrontia Corporation, Nec Corporation. Active years: 2006-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mariko Jinno. Retrieved from https://idiyas.com/inventor/mariko-jinno

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.1

ph-index = 6

Forward Citations = 105(Granted Patents)


Company Filing History:


Years Active: 2006-2013

Loading Chart...
6 patents (USPTO):Explore Patents

Title: Mariko Jinno: Innovator in Point-of-Sale Technology

Introduction

Mariko Jinno is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of technology, particularly in the development of point-of-sale systems. With a total of six patents to her name, Jinno has established herself as a key player in the innovation landscape.

Latest Patents

Among her latest patents is a cutting-edge point-of-sale terminal. This invention showcases her ability to blend functionality with user-friendly design, making transactions more efficient for businesses and consumers alike.

Career Highlights

Throughout her career, Mariko Jinno has worked with notable companies such as NEC Infrontia Corporation and NEC Corporation. Her experience in these organizations has allowed her to hone her skills and contribute to various technological advancements.

Collaborations

Jinno has collaborated with talented individuals in her field, including Natsuki Hagiwara and Kuninori Okanoya. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Mariko Jinno's work in point-of-sale technology exemplifies her dedication to innovation and her impact on the industry. Her patents and collaborations highlight her role as a leading inventor in Japan.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…