Philadelphia, PA, United States of America

Marian Morys

This inventor holds 2 USPTO granted patents. Top assignee: Solar Light Company, Inc.. Active years: 1998-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marian Morys. Retrieved from https://idiyas.com/inventor/marian-morys-qksbeg8f

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 2

Forward Citations = 43(Granted Patents)


Company Filing History:


Years Active: 1998-1999

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2 patents (USPTO):Explore Patents

Title: Innovations by Marian Morys

Introduction

Marian Morys is an accomplished inventor based in Philadelphia, PA. She has made significant contributions to the field of measurement technology, holding two patents that showcase her innovative spirit and technical expertise.

Latest Patents

Her latest patents include a universal measuring instrument with a signal processing algorithm. This reading meter is designed to work with various sensor heads, featuring a digital display, a processor, and memory. Each sensor head contains a memory that carries the processing algorithm specific to that sensor. The reading meter reads the detector head memory, converting raw sensor data into digital form and processing it according to the stored algorithm. This results in a desired display output. The device also includes a countdown counter programmed to track the calibration period for each sensor head.

Career Highlights

Marian Morys is currently associated with Solar Light Company, Inc., where she continues to develop innovative solutions in measurement technology. Her work has been instrumental in advancing the capabilities of measurement instruments, making them more versatile and efficient.

Conclusion

Marian Morys exemplifies the spirit of innovation through her patents and contributions to measurement technology. Her work not only enhances the functionality of measuring instruments but also sets a standard for future developments in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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