Hyogo, Japan

Maria O De Beeck

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Denki Kabushiki Kaisha. Active years: 1996.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Maria O De Beeck: Innovator in Lithography Techniques

Introduction

Maria O De Beeck is a prominent inventor based in Hyogo, Japan. She has made significant contributions to the field of lithography, particularly in the development of methods for forming resist patterns. Her innovative work has implications for semiconductor manufacturing and other advanced technologies.

Latest Patents

Maria O De Beeck holds a patent for a "Method of forming resist pattern and organic silane compound for forming." This patent describes methods that allow for precise control over the size of resist patterns during their formation. It also addresses the etching process of the underlying substrate, even when a step portion exists. The methods utilize far-ultra violet light in lithography, enhancing the efficiency and effectiveness of the process. The organic silane compound developed for this purpose includes a silicon atom and a leaving group that can bind covalently to the semiconductor substrate, ensuring a robust application.

Career Highlights

Maria O De Beeck is associated with Mitsubishi Denki Kabushiki Kaisha, where she has been instrumental in advancing lithography techniques. Her work has not only contributed to her company's success but has also positioned her as a key figure in the field of semiconductor technology.

Collaborations

Maria has collaborated with Tetsuro Hanawa, further enhancing her research and development efforts in lithography. Their partnership has led to innovative solutions that address complex challenges in the industry.

Conclusion

Maria O De Beeck's contributions to lithography and semiconductor manufacturing are noteworthy. Her innovative methods and collaborative efforts continue to influence the field significantly.

Profile summary based on public USPTO records.
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