Houston, TX, United States of America

Maria E Terron-Diaz

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Maria E Terron-Diaz. Retrieved from https://idiyas.com/inventor/maria-e-terron-diaz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 14.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Inventor Spotlight: Maria E Terron-Diaz

Introduction: Meet Maria E Terron-Diaz, an innovative inventor based in Houston, TX, with a groundbreaking patent in event detection using roles and relationships of entities.

Latest Patents: Maria E Terron-Diaz holds 1 patent for the method, system, and computer program product for event detection using roles and relationships of entities. This patent revolutionizes event detection by identifying training events, roles, behavior attributes, and relationships to construct event rules for new data.

Career Highlights: Maria E Terron-Diaz is a talented inventor currently working at International Business Machines Corporation (IBM), a renowned technology company. Her expertise and dedication have led to significant contributions in the field of event detection.

Collaborations: Maria E Terron-Diaz collaborates with esteemed coworkers such as Ying Chen and Linda Ha Kato at IBM. Together, they work on cutting-edge projects and drive innovation in the realm of entity-based event detection.

Conclusion: Maria E Terron-Diaz is a trailblazing inventor with a passion for pushing the boundaries of technology. Her impactful patent and collaborations exemplify her commitment to advancing the field of event detection. Keep an eye on Maria E Terron-Diaz for future groundbreaking innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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