Margaret C Johnson

Title: Innovations by Margaret C Johnson

Introduction

Margaret C Johnson is a distinguished inventor based in Cary, NC, known for her significant contribution to the field of electron microscopy. With one patent to her name, she has proven to be an influential figure in advancing analytical instruments that enhance our understanding of microscopic structures.

Latest Patents

Margaret's patent, titled "Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets," focuses on innovative methods to sense conditions within an electron microscope system. This patent discloses systems capable of sensing not only the conditions of the microscope but also the characteristics of the specimen being analyzed. Notably, it emphasizes the use of sparse datasets acquired through random sub-sampling, allowing for estimations of instrument parameters and specimen characteristics from limited data.

Career Highlights

Margaret currently works at the Battelle Memorial Institute, where she collaborates with fellow innovators to push the boundaries of scientific research and instrumentation. Her work not only enhances the capabilities of electron microscopy but also contributes to broader scientific advancements in material science and biomedical research.

Collaborations

Throughout her career, Margaret has collaborated with talented colleagues such as Bryan A Stanfill and Sarah M Reehl. These collaborations have fostered an environment of creativity and innovation, leveraging diverse expertise to achieve groundbreaking results in research and development.

Conclusion

Margaret C Johnson stands out as a remarkable inventor whose work has the potential to transform how electron microscopy is perceived and utilized. Her efforts at the Battelle Memorial Institute continue to inspire future innovations in the field, setting a high standard for inventors in the scientific community.