Guilford, CT, United States of America

Marek J Maryanskl

This inventor holds 1 USPTO granted patent. Top assignee: Yale University. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marek J Maryanskl. Retrieved from https://idiyas.com/inventor/marek-j-maryanskl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1997

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Marek J Maryanskl: Innovator in Energy Field Detection

Introduction

Marek J Maryanskl is a notable inventor based in Guilford, CT (US). He has made significant contributions to the field of energy detection and imaging. His work is particularly focused on advancing technologies that enhance our understanding of energy fields.

Latest Patents

Marek holds a patent for a groundbreaking invention titled "Three-dimensional detection, dosimetry and imaging of an energy field." This innovation represents a significant step forward in the ability to visualize and measure energy fields in three dimensions.

Career Highlights

Marek is affiliated with Yale University, where he continues to push the boundaries of research and innovation. His work at this prestigious institution has allowed him to collaborate with other leading experts in the field.

Collaborations

Marek has worked alongside esteemed colleagues such as John C Gore and Robert J Schulz. These collaborations have further enriched his research and contributed to the advancement of technology in energy field detection.

Conclusion

Marek J Maryanskl is a pioneering inventor whose work in energy field detection is shaping the future of this field. His contributions are invaluable, and his ongoing research promises to lead to further innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…