Cedar Park, TX, United States of America

Marcus Keiser

This inventor holds 1 USPTO granted patent. Top assignee: Texas Research International, Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marcus Keiser. Retrieved from https://idiyas.com/inventor/marcus-keiser

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: The Innovations of Marcus Keiser

Introduction

Marcus Keiser is an accomplished inventor based in Cedar Park, TX (US). He has made significant contributions to the field of composite materials through his innovative patent. His work focuses on enhancing manufacturing processes and ensuring the cleanliness of composite surfaces.

Latest Patents

Marcus holds a patent for a nondestructive sensing device and method for inspection and measuring the cleanliness of composite surfaces. This invention includes non-destructive sensing methods and devices for inspection and measuring in manufacturing applications. It also addresses the removal of contaminants from composite surfaces while coupling sensing and activation of these surfaces.

Career Highlights

Marcus Keiser is associated with Texas Research International, Inc., where he applies his expertise in composite materials. His innovative approach has led to advancements in manufacturing processes, particularly in ensuring the quality and cleanliness of composite surfaces.

Collaborations

Some of his notable coworkers include Doyle T Motes, III and Richard Piner. Their collaboration has contributed to the development of innovative solutions in the field of composite materials.

Conclusion

Marcus Keiser's work exemplifies the spirit of innovation in the field of composite materials. His contributions through his patent and collaboration with colleagues continue to impact manufacturing processes positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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