Company Filing History:
Years Active: 2004
Title: **Innovative Contributions of Marcus Freitag in Tip Calibration Technology**
Introduction
Marcus Freitag, based in Mohegan Lake, NY, has made significant strides in the field of microscopy through his innovative inventions. His expertise culminates in a patented technology that enhances the performance and accuracy of scanning probe microscopes.
Latest Patents
Freitag holds a patent for a "Tip calibration standard and method for tip calibration." This invention is focused on a sophisticated tip calibration standard designed to characterize both the geometric and electrostatic properties of probe tips utilized in scanning probe microscopes. The technology incorporates a carbon nanotube mounted on a dielectric surface of a grounded, conductive substrate, effectively connecting to a contact mounted on that substrate. The patent further details methods for using this standard to calibrate probe tips, compute tip geometry and electrostatic data, and separate tip-surface interaction effects from the surface image data produced by scanning probe microscopes.
Career Highlights
Marcus Freitag is affiliated with the University of Pennsylvania, where he contributes valuable insights and advancements in his field. His work enhances the practical application of microscopy in various research areas, reinforcing the university's commitment to cutting-edge innovation.
Collaborations
In his professional journey, Freitag collaborates with notable colleagues such as Dawn A Bonnell and Alan T Johnson. These partnerships underscore the collaborative nature of scientific research and the shared goal of pushing the boundaries of existing technology.
Conclusion
Through his indispensable contributions and groundbreaking inventions, Marcus Freitag exemplifies the spirit of innovation in scientific research. His patent for tip calibration not only advances the functionality of scanning probe microscopes but also showcases the potential for further developments within the field.