The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2004
Filed:
Jan. 17, 2003
Dawn Bonnell, West Chester, PA (US);
Alan T. Johnson, Philadelphia, PA (US);
Sergei V. Kalinin, Knoxville, TN (US);
Marcus Freitag, Mohegan Lake, NY (US);
Trustees of the University of Pennsylvania, Philadelphia, PA (US);
Abstract
The present invention is directed to a tip calibration standard for characterizing the geometric and electrostatic properties of the probe tips of scanning probe microscopes comprising a carbon nanotube mounted on a dielectric surface of a grounded, conductive substrate and connected to a contact mounted on the substrate. The present invention is also directed to methods for using such a tip calibration standard in calibrating probe tips, computing tip geometry and electrostatic data, and determining the convolution function so that tip-surface interaction effects can be separated from scanning probe microscope surface image data.