Veddige, Sweden

Marcus David Björk

This inventor holds 1 USPTO granted patent. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Marcus David Björk. Retrieved from https://idiyas.com/inventor/marcus-david-bjork

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Marcus David Björk: Inventor in Network Quality-of-Experience Measurement

Introduction

Marcus David Björk is an inventor associated with Veddige, Sweden. His patent work addresses how machine learning can help determine the quality of experience (QoE) for applications carried over computer networks.

Latest Patents

Björk is credited with 1 patent: “System and Method for Determining Mean Opinion Score for Application Quality of Experience.” The invention describes a system that collects network traffic-flow data and extracts features from the collected parameters. A machine-learning model is trained to estimate the mean opinion score (MOS), which the system then monitors alongside network traffic to assess application QoE.

The corresponding method involves collecting network-flow data, extracting a feature set, training a model to estimate MOS, deploying the model to monitor traffic, and determining QoE from the resulting MOS. This approach connects measurable network characteristics with an estimate of users’ application experience.

Career Highlights

The available information highlights Björk’s contribution to network analytics through a patent focused on machine-learning-based MOS estimation. The invention’s described components include a logic module for data collection and feature extraction, a model module for training, and a traffic action module for monitoring MOS and determining QoE.

Collaborations

Björk’s listed coworkers include Alexander Havang and Swaminathan Srinivasan.

Conclusion

Marcus David Björk’s patent describes a machine-learning approach to estimating application quality of experience from network traffic, linking network-flow analysis with MOS-based assessment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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